Wei Huang

Non-destructive plasma frequency measurement for a semiconductor thin film using broadband surface plasmon polaritons
Non-destructive plasma frequency measurement for a semiconductor thin film using broadband surface plasmon polaritons
Investigation of terahertz surface plasmon modulation with optical injection of free carriers
Investigation of terahertz surface plasmon modulation with optical injection of free carriers
Detection of defects on the surface of a semiconductor by terahertz surface plasmon polaritons

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