Non-destructive plasma frequency measurement for a semiconductor thin film using broadband surface plasmon polaritonsTao Yang, Jia-Cheng Ge, Xing-Ao Li, Rayko Ivanov Stantchev, Yong-Yuan Zhu, Yuan Zhou, Wei HuangLast updated on Sat 04-Feb-2023Cite DOIPlasma Frequency; Characteristic Surface Plasmon Frequency; Surface Plasmon Polaritons; Semiconductor; Terahertz