Non-destructive plasma frequency measurement for a semiconductor thin film using broadband surface plasmon polaritonsTao Yang, Jia-cheng Ge, Xing-ao Li, Rayko Ivanov Stantchev, Yong-yuan Zhu, Yuan Zhou, Wei HuangLast updated on Sat 04-Feb-2023Cite DOIPlasma frequency; characteristic surface plasmon frequency; surface plasmon polaritons; semiconductor; terahertz